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Device under test - Wikipedia, the free encyclopedia
(Redirected from Devices Under Test) Jump to: navigation, search ... In this way, the ATE determines whether the particular device under test is good or bad. ...
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Agilent | N2X | Devices Under Test
Products for testing and troubleshooting Data ... Devices under Test ... Network Services Infrastructure Devices Under Test Technology Industry Solutions ...
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Device Under Test
priate operating point of the device. under test to maximize efficiency and ... of the devices under test receive the. same stress from the source, and pro ...
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Agilent | NetworkTester | Devices Under Test
Products for testing and troubleshooting Data communications networks. ... Wireline Communications Test Equipment > NetworkTester > Devices Under Test ...
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In-circuit test - Wikipedia, the free encyclopedia
... pin makes contact with one node in the circuitry of the DUT (Device Under Test) ... (Test the operation of digital components and Boundary scan devices) ...
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Device under test (DUT), also known as unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing.

In semiconductor testing In semiconductor testing, DUT refers to a specific die on a Wafer (electronics) or the resulting packaged part. Using a connection system, the part is connected to a piece of Semiconductor curve tracer or automatic test equipment. The ATE then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device. In this way, the ATE determines whether the particular device under test is good or bad.

While in the form of a wafer, the ATE connects to the individual DUTs (dice) using a set of microscopic needles. Once the chips are sawn apart and packaged, the ATE connects to the DUTs (packages) using ZIF (sometimes called contactors).

General electronic testing The term DUT is also used more generally within electronics to refer to any electronic assembly under test. For example, cell phones coming off of an assembly line may be given a final test in the same way as the individual chips were earlier tested. Each cell phone under test is, briefly, the DUT.

The DUT is often connected to the ATE using a bed of nails of pogo pins.